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TTTC's Electronic Broadcasting
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IEEE
Test Technology Educational Program 2016 Foz do Iguaçu, Brazil http://ttep.tttc-events.org/ttep/tutorials.html Registration is open! |
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LATS 2016 - CALL FOR TUTORIALS PARTICIPATION
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The Test Technology Educational Program
(TTEP’16) of the TTTC is offering 2 half-day
tutorials during the Saturday after the 17th IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW).
This year, the TTEP tutorials will touch the most
important topics of the test scenario, problems and
solutions taught by recognized experts of the field. |
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Register for the 17th IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) in the Registration Page http://www.feng.pucrs.br/~sisc/LATS2016/Registration.html. |
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April 9, 2016 (Saturday)
Morning (8:30 - 12:00) Tutorial 1: Combining structural and functional test approaches across system levels Authors:
This tutorial introduces into the best practices, current challenges and advanced techniques of high quality system-level test and diagnosis. Specialized techniques and industrial standards of testing complex systems (which may correspond to a System on Chip, board or interconnected system) are introduced. The reuse for system test of design for test structures and test data developed at module level is discussed, including the limitations and research challenges. Structural test methods have to be complemented by functional test methods; hence, state-of-the-art and leading edge research for functional testing are covered. Solutions change depending on the scenario (manufacturing test or in field test) and the goal (test or diagnosis). The tutorial also discusses the role of standards and regulations in the area. Test cases are described and discussed. INTENDED AUDIENCE:Board-level test, JTAG, Functional test, Structural test, Scan-based test,Embedded Instrumentation, Processor test Afternoon (14:00 - 17:30) Tutorial 2: Hierarchical Test for Today’s SOC and IoT Author:
INTENDED AUDIENCE: Engineers and managers responsible for design, test, quality or yield of a product; Engineers and managers responsible for product engineering and technology bring-up; Engineers involved in manufacturing production or process development; Anyone involved with the financial impact of low yield or low product quality. |
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| Additional Information | |
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Paolo Bernardi
Onnik Yaglioglu |
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GENERAL CHAIR
VICE CHAIR (PROGRAM)
PAST CHAIR
FINANCE CHAIR
PUBLICITY CHAIR
PLANNING CHAIR
INDUSTRIAL RELATIONS CHAIR
AUDIO/VISUAL CHAIRS
ELECTRONIC MEDIA CHAIRS
ORGANIZING LIASONS
PROGRAM COMMITTEE
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For more information, visit us on the web
at: http://ttep.tttc-events.org/ttep/tutorials.html
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The Test Technology Educational Program 2016 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) |
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IEEE Computer Society- Test Technology
Technical Council
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TTTC CHAIR PAST CHAIR TTTC 1ST VICE CHAIR SECRETARY ITC GENERAL CHAIR TEST WEEK COORDINATOR TUTORIALS AND EDUCATION STANDARDS EUROPE MIDDLE EAST & AFRICA STANDING COMMITTEES ELECTRONIC MEDIA |
PRESIDENT OF BOARD SENIOR PAST CHAIR TTTC 2ND VICE CHAIR FINANCE IEEE DESIGN & TEST EIC TECHNICAL MEETINGS TECHNICAL ACTIVITIES ASIA & PACIFIC LATIN AMERICA NORTH AMERICA COMMUNICATIONS INDUSTRY ADVISORY BOARD |
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